In development a course on the reliability of cmos analog circuits which includes the influence of hot carrier injection oxide integrity time dependent dielectric breakdown negative bias temperature instability and electro migration. Respected authors phil allen and doug holberg bring you the third edition of their popular textbook cmos analog circuit design working from the forefront of cmos technology phil and doug have combined their expertise as engineers and academics to present a cutting edge and effective overview of the principles and techniques for designing circuits. While the paperback indian edition is not the best option in quality but for me its comparable and satisfied based on the price range.
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